The state change results from the free charge created by ionization in or close to an important node of a logic element (e.g., memory "bit"). The device output or operation error caused by the strike is called an SEU or a soft error. The SEU itself is not considered permanently damaging to the transistor's or circuits' functionality, unlike the case of single-event latch-up (SEL), single-event gate rupture (SEGR), or single-event burnout (SEB). These are examples of a general class of radiation effects in electronic devices called single-event effects (SEEs).

The sources of the particles causing these SEUs may be the high-energy cosmic rays moving closely at the speed of light coming from supernovae, black holes. These cosmic rays affect our lives daily. This ranges from our personal computers, airplanes, space missions either to another planet or deep space observations, as well as on our own DNA. Mr. Musharraf talked about the origin of the research in Cosmic Radiation, the well-known cases where the effects of Cosmic Radiation, also known as Single Event Upsets (SEU), are real, and the challenges we face in identifying and prevent such events.